UVISEL & UVISEL2

Characterization of Photovoltaic Devices by Spectroscopic Ellipsometry

Much of solar cell research is focused on making solar cells cheaper and more efficient, so that they can more effectively compete with other energy sources. Much of this optimization requires accurate characterization of film thickness and absorption efficiency for the thin film used to manufacture the cells.


Schematic cross-section of
thin film a-Si:H photovoltaic cell

Spectroscopic ellipsometry is an optical measurement technique used to determine thin film thickness and optical constraints simply and accurately. This application note illustrates the ability of the technique to characterize photovoltaic devices. The materials commonly studied include: amorphous silicon, poly silicon, ZnO, ITO, SnO2, TiO2, Sinx, MgO, etc.

Spectroscopic ellipsometry is an ideal technique to characterize film thickness and optical constants for photovoltaic applications. Spectroscopic ellipsometers are also sensitive to the presence of rough overlayer and graded optical constants.

The technique provides the advantage to be fast, simple to operate and non-destructive for the characterization of the samples.

Click here to read the full application note on Photovoltaic Devices by Spectroscopic Ellipsometry

The Horiba Jobin Yvon UVISEL Range
The UVISEL ellipsometer range offers the best combination of modularity and performance for advanced thin film, surface and interface characterization.

UVISEL - Spectroscopic Ellipsometer from FUV to NIR

The UVISEL Spectroscopic Phase Modulated Ellipsometer (SPME) is a unique instrument that incorporates photoelastic device to modulate the polarization without any mechanical movement. Owing to the phase modulation technology the UVISEL spectroscopic ellipsometer performs advanced measurements of the degree of polarization, anisotropy and Mueller Matrix elements. Read More...

UVISEL2: Spectroscopic Phase Modulation Ellipsometry

High resolution scanning monochromator

The new UVISEL2 ellipsometer offers the best combination of modularity and performance for advanced thin film, surface and interface characterization.

Highest modulation frequency in the market (50 kHz) Read More...

Should you have any questions about your application and the UVISEL systems, please This e-mail address is being protected from spambots. You need JavaScript enabled to view it

News & Announcements

  • IMPORTANT UPDATE! The workshop has been moved to November 30 to December 1

    SIRIM, in cooperation with Horiba Scientific are holding a workshop, "Photoluminescence of Sol-Gel Derived Materials and Optical Fibers for Photonic Applications." Read More...

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